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Wyniki wyszukiwania dla: radiation
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Measurements of radiation emission of a portable power bank with a capacity of 10400 mAh
Dane BadawczeThe dataset contains the emission measurement results that are part of comprehensive tests carried out for portable power banks with different capacities. The measurements were performed in the frequency range from 30 MHz to 3 GHz using a Gigahertz Transverse Electromagnetic (GTEM) cell (Fig. 1). The test setup was configured to measure a portable power...
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Measurements of radiation emission of a portable power bank with a capacity of 5200 mAh
Dane BadawczeThe dataset contains the emission measurement results that are part of comprehensive tests carried out for portable power banks with different capacities. The measurements were performed in the frequency range from 30 MHz to 3 GHz using a Gigahertz Transverse Electromagnetic (GTEM) cell. The test setup was configured to measure a portable power bank...
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Measurements of radiation emission of a portable power bank with a capacity of 2600 mAh
Dane BadawczeThe dataset contains the emission measurement results that are part of comprehensive tests carried out for portable power banks with different capacities. The measurements were performed in the frequency range from 30 MHz to 3 GHz using a Gigahertz Transverse Electromagnetic (GTEM) cell. The test setup was configured to measure a portable power bank...
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Radiation pattern measurements of geometrically small antennas performed in non-anechoic environments
Dane BadawczeThe dataset contains unprocessed measurements of radiation pattern characteristics performed in non-anechoic regime for three geometrically small antenna structures: a spline-parameterized Vivaldi structure, a compact spline-based monopole, and a quasi-Yagi geometry with enhanced bandwidth. The responses have been obtained over broad frequency ranges...
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Measurements of electrically small antenna radiation patterns in non-anechoic environments using TGM
Dane BadawczeThe dataset contains raw and processed measurements of radiation pattern characteristics performed in non-anechoic regime for four antenna structures: a spline-parameterized Vivaldi structure, a compact spline-based monopole, super-ultrawideband antenna, and a quasi-Yagi component. The responses have been obtained at the selected frequencies of interest...
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Wind speed, wind direction and solar radiation datasets; wind and solar energy resources analysis
Dane BadawczeDataset contain the results of wind speed, wind direction and solar radiation for wind and solar energy resources analysis performed in years 2008 and 2009. Application for efficiency and profitability of solar and wind power plants anaylsis and for energy generation forecasting algorithms design and anaysis. Datasets used in doctoral dissertations,...
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Solar radiation (PAR, UV-B and UV-A) reaching the sea surface - Gdańsk Deep (2001-2005)
Dane BadawczeSolar radiation reaching the sea surface was measured in spring (2001, 2003, 2005) and autumn (2002, 2004). For measurements of the photosynthetic active radiation - PAR (400-700 nm), the Ejkelkamp SKP 210 / I 0896 13595 sensor was used, the UV-B radiation (280-315 nm) was measured with the Ejkelkamp SKU 430 0497 14854 sensor, while UV-A (315- 380 nm)...
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X-ray diffraction (XRD) of pristine bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al)
Dane BadawczeThese data contain XRD (X-ray Diffraction) patterns of PMH, PMD and simulated MIL-53(Al). The results were recorded by a Philipsdiffractometer using Cu Ka radiation. Sample abbreviations (PMH, PMD, MIL-53(Al)) are in agreement with the markings used in the linked publication.
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XRD patterns of MXenes ashes obtained after TGA measurement
Dane BadawczeData contain results from XRD measurements of the product (ashes) produced after TGA of MAX Phase, MXene HF, MXene HF/HCl 1:3 and MXene HF/H2SO4 1:3 . The measurements were performed in AERIS PANalytical X-ray diffractometer with Cu-Ka radiation.
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XPS (X-ray photoelectron spectroscopy) survey spectra of CPMD and CPMH
Dane BadawczeXPS (X-ray photoelectron spectroscopy) survey spectra of CPMD and CPMH. XPS spectra were obtained using Al Kɑ (hv=1486.6 eV) radiation with a Prevac system equipped with a Scienta SES 2002 electron energy analyzer operating at constant transmission energy (Ep=50 eV). Sample abbreviations (CPMD, CPMH) are in agreement with the markings used in the linked...
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The XAS spectra of O-K edges, M-L edges and Ce-M edges in Ce0.9M0.1O2
Dane BadawczeThe dataset consists of XAS spectra of O-K edges, M-L edges of Ce0.9M0.1O2 (where M=Mn, Fe, Co, Ni, Cu) synthesised by reverse microemulsion method. XAS spectra were collected at PIRX beamline in SOLARIS National Synchrotron Radiation Centre. Measurements were perfomed under ultra high vacuum in total electron yield (TEY) mode.
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XPS data of as-grown BDD, as-implanted Mn-BDD, and annealed Mn-BDD thin films
Dane BadawczeXPS survey spectra and detailed spectra O1, C1s and Mn2p of as-grown BDD, as-implanted Mn-BDD, and annealed Mn-BDD thin films. X-ray photoelectron spectroscopy (XPS) studies were conducted on an Escalab 250 Xi from Thermo Fisher Scientific with an Al Kα radiation. Results were published in the paper ( https://doi.org/10.1002/adfm.202308617)
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X-ray diffraction (XRD) of silica-coated bismuth oxide (Bi2O3) and gadolinium oxide (Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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X-ray diffraction (XRD) of silica-coated bismuth oxide/gadolinium oxide (Bi2O3+Gd2O3) structures
Dane BadawczeData contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
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XRD patterns of the V2O5 nanorods after thermal treatment under reducing atmosphere
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 nanorods after thermal treatment under a reducing atmosphere. Samples were annealed at 450C for 2, 20, and 40h under a reducing atmosphere (94% Ar, 6% H2).
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XRD patterns of ammonium vanadate nanocrystals
Dane BadawczeThe DataSet contains the XRD patterns of ammonium vanadate nanobelts obtained by the hydrothermal method with different conditions. The results show that the structure and phase compositions of samples dependent on reaction conditions.
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XRD patterns of VO2 and V6O13 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V6O13 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under a reducing atmosphere (94% Ar, 6% H2) at 500, 600 and 700C for 10h.
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XRD patterns of V2O5 thin film morphology dependent on substrate types
Dane BadawczeThe DataSet contains the XRD patterns of the V2O5 thin film structure dependent on substrate types. The as-prepared thin films were deposited on alumina, zirconium, zirconium oxide and metallic vanadium substrate, then was annealing under an oxidizing atmosphere at 600C for 10h.
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XRD patterns of V2O5 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of vanadium pentaoxide nanostructures obtained by the sol-gel with different annealing temperatures under synthetic air. The results show that crystallinity dependent on the annealing temperature.
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XRD patterns of VO2 and V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The information about xerogel powder synthesis is described in the Journal of Nanomaterials. The xerogel powder was annealing under argon atmosphere in the temperature range 400-1000C. The results show that the morphology...
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XRD patterns of vanadium oxide nanostructures on silicon substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on silicon substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of VO2 and V2O3 thin films obtained at 500°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (3-9 AsP layers) were deposited on a silicon substrate and were annealing at 500°C under an argon atmosphere.
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XRD patterns of vanadium oxide nanostructures on quartz glass substrate obtained by V2O5 recrystallization
Dane BadawczeThe DataSet contains the XRD patterns of vanadium oxide nanostructures on quartz glass substrates obtained by recrystallization of V2O5 thin films between 800-1200°C under synthetic air. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials.
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XRD patterns of VO2 and V2O3 thin films obtained at 700°C
Dane BadawczeThe DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (5-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon atmosphere.
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XPS data of deuterium and hydrogen grown boron-doped diamond
Dane BadawczeThe high-resolution C1s X-ray absorption spectra of BDD@H and BDD@D samples were measured using the facilities of the HE-SGM beamline (HE-SGM) at the BESSY II synchrotron radiation source of Helmholtz–Zentrum Berlin (HZB).[90] The measurements were carried out under ultra-high vacuum conditions: P ≈ 2×10−9 Torr at T = 300 K. The NEXAFS spectra were...
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X-ray diffraction (XRD) and particle size distribution (PSD) data of iron oxide (Fe3O4) - magnetite particles
Dane BadawczeDataset presenting X-ray diffractogram and particle size distribution of nanomagnetite (Fe3O4) iron oxide particles purchased from Sigma Aldrich (637106).X-ray diffraction study was performed with a PRO X-ray diffractometer (X’Pert PRO Philips diffractometer, Co. Ka radiation, Almelo, Holland), while PSD was determined using laser diffraction technique...
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The XRD diffraction patterns of Ce(Pr,Sm)O2-s samples
Dane BadawczeThe dataset includes XRD diffraction patterns of Ce(Pr,Sm)O2-s samples of various stoichiometries of Pr and Sm dopants. Samples were produced using aqueous soft chemistry methods (microemulsion method).
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XRD patterns of V2O5 thin films deposited on silicon substrate
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a silicon substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range of 300-600C. The results show that the structure of the films dependent on the annealing temperature.
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XRD patterns of V2O3 nanostructures
Dane BadawczeThe DataSet contains the XRD patterns of V2O3 nanostructures obtained by the sol-gel with different reaction conditions. The xerogel powder was annealing under a reducing atmosphere (94% Ar, 6% H2) in the temperature range 350-700C. The results show that crystallinity dependent on the annealing temperature.
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Structure evolution of V2O5 thin films deposited on quartz glass substrate - High-Temperature X-ray Diffraction
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on guartz glass. The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the quartz glass substrate. The structure was measured in-situ during heating between 50-800°C under synthetic...
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Structure evolution of V2O5 thin films deposited on silicon substrate - High-Temperature X-ray Diffraction
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on silicon substrates (111). The thin films were obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the silicon substrate. The structure was measured in-situ during heating between 50-800°C under...
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XRD patterns of V2O5 thin films deposited on quartz glass
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on a quartz glass substrate. The as-prepared thin films were annealing under an oxidizing atmosphere in the temperature range 200-600C. The results show that the structure of the films dependent on the annealing temperature.
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XPS data of MXene catalyst
Dane BadawczeData contain results from XPS measurement of the Ti3C2Tx MXenes produced via acidic etching aluminum from MAX Phase (Ti3C2-Al-Ti3C2-Al-Ti3C2) using 48% HF etching agent (MXene HF). The X-ray spectroscopy (XPS) measurements were conducted using Mg Ka (hn = 1253.6 eV) radiation in a Prevac (Poland) system equipped with a Scienta SES 2002 (Sweden) electron...
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Structural investigations of the Al2O3 ultra thin films
Dane BadawczeUltra-thin layers of Al2O3 were deposited by atomic layer deposition (ALD) (Beneq TFS 200 ALD system). This method provides precise thickness control down to a single atomic layer. The precursors used were trimethylaluminum (Sigma-Aldrich) and purified water. The deposition of the atomic layer was carried out at 200 °C. Samples with a thickness of 2...
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XRD patterns of MXenes catalysts
Dane BadawczeData contain results from XRD measurements of the Ti3C2Tx MXenes produced via acidic etching aluminum from MAX Phase (Ti3C2-Al-Ti3C2-Al-Ti3C2) using different etching agents, HF/HCl and HF/H2SO4 with different weight ratios (1:3, 1:4, and 1:5). The samples were labeled as MXene HF/HCl X:Y and MXene HF/H2SO4 X:Y, where X:Y means the acids weight ratios....
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The structure of lead-silicate glasses and nanocomposites doped with iron oxide
Dane BadawczeThe structure of iron-doped glasses and glass-ceramics were studied. Samples has the composition of 50SiO2–(50−x)PbO–xFe2O3, where x=15, 20 and 25 (in mol%). All samples were prepared by the conventional melt quenching technique; the melting was conducted in air at 1623 K in alumina crucibles. The melts were poured on a brass plate preheated to 573...
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XRD patterns of TeOx powder
Dane BadawczeThe DataSet contains the XRD patterns of the TeOx powder. The material was obtained by the sol-gel method. The starting solution was prepared by mixing telluric acid (precursor) with thetraetylene glycol, water, and ethanol. The sol was obtained by vigorously stirring precursor solution at 50°C for 2h, then the temperature was raised to 75°C for the...
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SWM for porous hierarchical nanocarbons composites
Dane BadawczeRaw Raman spectra and XRD diffractograms (background subtracted) of 13 among which carbon-derived secondary waste and reference materials.
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The structure of lead-silicate glasses containing nanocrystallites of iron oxides
Dane BadawczeThe structure of iron-doped glasses and glass-ceramics were studied. Samples has the composition of (50 − 0.5x)SiO2–(50 − 0.5x)PbO–xFe2O3, where x = 2, 5, 10, 15, 20 and 25 (in mol%). All samples were prepared by the conventional melt quenching technique; the melting was conducted in air at 1623 K in alumina crucibles. The melts were poured on a brass...
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XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111)
Dane BadawczeThe DataSet contains the XRD patterns of V2O5 thin films deposited on isotropic etching silicon substrates (111). The silicon wafers were etched in a mixture of nitric acid, hydrofluoric acid, and acetic acid in the ratio of 40:1:15. The soaking time for the substrates was from 30 to 90 seconds. The thin films were obtained by the sol-gel method. ...
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X-Ray diffraction of the metallic nanostructures
Dane BadawczeMetallic nanostructures (gold and silver) were manufactured as a thermal annealing of gold or silver thin film. Gold films with thickness of 2.8 nm were deposited on a silicon substrates using a table-top dc magnetron sputtering coater (EM SCD 500, Leica), equipped with quartz microbalance for in-situ thickness measurements. Films were deposited from...
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Correction of far-field measurements obtained in non-anechoic test site
Dane BadawczeThe dataset contains raw and processed measurements of radiation pattern characteristics performed in non-anechoic regime for two geometrically small antenna structures: a spline-parameterized Vivaldi structure and a compact spline-based monopole. The responses have been obtained at the selected frequencies of interest as a function of mentioned structures...
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Morphology and structure of V2O5 nanorods deposited on the silicon substrate after reduction
Dane BadawczeThe DataSet contains the XRD patterns and SEM micrographs of V2O5 nanorods on the silicon substrate after thermal treatment under a reducing atmosphere. Thin films were annealed at 500C for 40 under a reducing atmosphere (94% Ar, 6% H2).
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The structure of lead-borate glasses containing nanocrystallites of iron oxides
Dane BadawczeThe structure of iron-doped glasses and glass-ceramics were studied. Glass samples of composition of xFe2O3–(100 − x)(B2O3–2PbO) (2.5 b x b 37, in mol%) were prepared by the conventional melt quenching technique. The melting was conducted in alumina crucibles at the temperature of 1523 K. The melts were poured on a preheated (573 K) brass plate and...
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The structure of vanadate glass-ceramics containing BaTiO3 measured with X-ray diffraction method
Dane BadawczeThe structure of vanadate glass-ceramics doped with BaTiO3 was measured by XRD. Samples of the composition of x[BaO,TiO2]–(80 − x)V2O5–20Bi2O3 where x = 5, 10 and 15 in mol% were prepared by a conventional melt quenching technique. The melting was performed in alumina crucibles at the temperature of 1273 K–1373 K. The melts were poured on a preheated...
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Structure of ammonium vanadate synthesis by LPE-IonEx method
Dane BadawczeThe DataSet contains the XRD patterns, FTIR spectra of NH4VO3 crystals with different morphology obtained by the LPE-IonEx method.
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The luminescence study of Sr0.98Li2.5 + zAl1.5 – zO3 + 2zN1 – 2z:0.02Eu coumpounds.
Dane BadawczeEu2+-doped UCr4C4-type oxynitride phosphors are emerging innovative materials to replace oxide and nitride phosphors for high-end light-emitting devices. A series of Sr0.98Li2.5 + zAl1.5 – zO3 + 2zN1 – 2z:0.02Eu phosphors were synthesized by collaborators from the National Taiwan University by precursor engineering, and these products showed an unexpected...
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XRD diffraction patterns for strontium ferrite molybdate-based compounds: as-prepared, reduced and reoxidized
Dane BadawczeThe dataset contains the XRD diffractograms collected at room temperature for SFM, LSFM and SFMNb in 3 different oxidation states, namely: as-prepared, reduced and reoxidized.
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Raman data of deuterium and hydrogen grown boron-doped diamond
Dane BadawczeRaman spectra were recorded at room temperature using a micro-Raman spectrometer (Invia, Renishaw) equipped with an edge filter with different excitation wavelengths and lasers: UV λ = 325 nm (HeCd), blue λ = 488 nm (Ar+), green λ = 514 nm (Ar+), and IR λ = 785 nm (IR diode) and 50× microscope objective. To avoid sample heating, the radiation power...